Transfer Learning for Keypoint Detection in Low-Resolution Thermal TUG Test Images
机构 * Research Center for Information Technology Innovation, Academic Sinica, Taiwan(信息科技创新研究中心,学术院,台湾) ; Graduate Institute of Electrical Engineering, National Taiwan University, Taiwan(电气工程研究生院,国立台湾大学,台湾) ; Bachelor’s Program in Medical Informatics and Innovative Applications, Fu Jen Catholic University, Taiwan(医学信息学与创新应用学士班,辅仁大学,台湾) ; Department of Electrical Engineering, National Taiwan University, Taiwan(电气工程系,国立台湾大学,台湾) ; College of Information and Computer Sciences, University of Massachusetts Amherst, MA, 01003, USA(信息与计算机科学学院,马萨诸塞大学阿姆赫斯特分校,美国) ; Department of Electrical Engineering, National Taiwan University of Science of Technology, Taiwan(电气工程系,国立台湾科技大学,台湾)
Comments Accepted to AICAS 2025. This is the preprint version
Journal ref 2025 IEEE 7th International Conference on Artificial Intelligence Circuits and Systems (AICAS)