Generalization in Metric Learning: Should the Embedding Layer be the Embedding Layer?
Comments new version for WACV
期刊&会议
Winter Conference on Applications of Computer Vision · 会议 · Computer Vision
Comments new version for WACV
Comments 10 pages, 9 figures, this manuscript is accepted in WACV 2019
Comments Accepted at WACV 2019
Comments WACV 2019; Project page at https://poier.github.io/murauer
Comments To appear in WACV 2019
Comments 9 pages(including references); WACV 2019
Comments Work accepted at IEEE Winter Conference on Applications of Computer Vision (WACV 2019)
Comments To appear at WACV 2019
Comments WACV'19
Comments Paper accepted for publication at the IEEE Winter Conference on Applications of Computer Vision - 2019
Comments First two authors contributed equally, to Appear in the IEEE Winter Conference on Applications of Computer Vision (WACV) 2019
Comments IEEE Winter Conference on Applications of Computer Vision. arXiv admin note: text overlap with arXiv:1808.08348
Comments Accepted to WACV 2019. This is a preprint version
Comments Accepted for publication at IEEE WACV 2018
Comments Accepted in WACV 2017
Comments To appear at WACV 2019
Comments Accepted to IEEE Winter Conference on Applications of Computer Vision 2019 (WACV 2019)
Comments Accepted by WACV 2019
Comments WACV 2019
Comments To appear in IEEE Winter Conference on Applications of Computer Vision (WACV) 2019
Comments accepted in WACV 2019
Comments Accepted publication at WACV 2019
Comments 10 pages, 5 figures, 8 tables, Accepted to WACV 2019
Comments 9 Pages, 4 Figures, 6 Tables; Accepted for publication in IEEE Winter Conference on Application of Computer Vision (WACV) 2019, Hawaii, USA
Comments IEEE Winter Conference on Applications of Computer Vision (WACV), 2019
Comments Accepted publication at WACV 2019
Comments IEEE Winter Conference on Applications of Computer Vision (WACV), 2019
Comments WACV 2019
Comments Accepted at IEEE WACV 2019, Hawaii USA
Comments Paper accepted in WACV 2019. See https://drive.google.com/open?id=1VkS8n1mKvAWjEPkiOA28XgY6VNfrsWYo for supplementary materials