Picometre-scale real-time drift correction in TEM and STEM by dynamic control of the specimen stage for atomic-resolution imaging
用于原子分辨率成像的透射电子显微镜(TEM)与扫描透射电子显微镜(STEM)中通过动态控制样品台实现皮米级实时漂移校正
专题命中 多模态训练与对齐 :multimodal(abstract)
AI总结 本研究开发无需硬件修改的动态控制软件框架,通过控制样品台实现皮米级实时漂移校正,提升TEM、STEM成像质量,支持原子分辨率成像及各类实验应用。
Comments 27 pages, 9 figures. Submitted to Ultramicroscopy Christophe Gatel: Writing original draft, Software, Methodology, Investigation, Data treatment, Conceptualization, Resources, Funding acquisition. Julien Dupuis: Software, Conceptualization, Methodology. Teresa Hungria: STEM experiment, Review & editing. Martin Hytch: Review & editing, Data treatment, Resources, Funding acquisition